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A median run length-based double-sampling X ¯ $$ \overline{X} $$ chart with estimated parameters for minimizing the average sample size
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A median run length-based double-sampling X ¯ $$ \overline{X} $$ chart with estimated parameters for minimizing the average sample size
Journal
The International Journal of Advanced Manufacturing Technology
ISSN
0268-3768
Date Issued
2015-03-25
Author(s)
W. L. Teoh
Michael B. C. Khoo
Philippe Castagliola
S. Chakraborti
DOI
http://link.springer.com/article/10.1007/s00170-015-6949-x
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(MD5):21881560e0c3c9c06b18c6e8fdc11acf
