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Lee Kong Chian Faculty of Engineering and Science
Published Scholarly Output
Microwave Non-destructive Testing Using K-Medoids Clustering Algorithm
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Microwave Non-destructive Testing Using K-Medoids Clustering Algorithm
Journal
Lecture Notes in Electrical Engineering
Proceedings of the 12th International Conference on Robotics, Vision, Signal Processing and Power Applications
ISSN
1876-1100
Date Issued
2024
Author(s)
Tan Shin Yee
Muhammad Firdaus Akbar
Nor Azlin Ghazali
Ghassan Nihad Jawad
Nawaf Shrifan
Lee Kong Chian Faculty of Engineering and Science
DOI
https://link.springer.com/chapter/10.1007/978-981-99-9005-4_42
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Book & Book Chapter.png
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18.2 KB
Format
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Checksum
(MD5):6459b36f69f027e855edacb3be8e57e9
