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Lee Kong Chian Faculty of Engineering and Science
Published Scholarly Output
Characterization and modeling of curvature sensor for microwave measurements
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Characterization and modeling of curvature sensor for microwave measurements
Journal
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL)
Date Issued
2017-11
Author(s)
Kim Yee Lee
Lee Kong Chian Faculty of Engineering and Science
Ee Meng Cheng
Kok Yeow You
Yeong-Nan Phua
Lee Kong Chian Faculty of Engineering and Science
Eng-Hock Lim
Lee Kong Chian Faculty of Engineering and Science
DOI
https://doi.org/10.1109/PIERS-FALL.2017.8293194
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ProceedingsConference.png
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Checksum
(MD5):305290eae19885e3ad5813824a3510c7
