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Effect of trace platinum additions on the interfacial morphology of Sn–3.8Ag–0.7Cu alloy aged for long hours
Journal
Microelectronics Reliability
ISSN
0026-2714
Date Issued
2014-11
Author(s)
Karen M.C. Wong
Yee Kai Tian
DOI
10.1016/j.microrel.2014.06.014
File(s)
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Journal Article.png
Size
3.11 KB
Format
PNG
Checksum
(MD5):21881560e0c3c9c06b18c6e8fdc11acf
