Performance analysis of 22 nm deep submicron NMOS transistors

Journal

2015 6th Asia Symposium on Quality Electronic Design (ASQED)

Date Issued

2015-08

Author(s)

Jor Gie Liew

Zairi Ismael Rizman

DOI

10.1109/ACQED.2015.7274020

File(s)

Name

ProceedingsConference.png

Size

28.25 KB

Format

PNG

Checksum

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