DIELECTRIC MEASUREMENTS FOR LOW-LOSS MATERIALS USING TRANSMISSION PHASE-SHIFT METHOD
Journal
Jurnal Teknologi
ISSN
2180-3722
Date Issued
2015-11-16
Author(s)
K. Y. You
Y. S. Lee
L. Zahid
M. F. A. Malek
K. Y. Lee
E. M. Cheng
N. H. H. Khamis
DOI
10.11113/jt.v77.6286
Abstract
This paper presents a calculation of the dielectric properties of low-loss materials using the transmission phase-shift method. This method can provide calibration-independent and position-insensitive features, and it was verified experimentally by measuring several well-known samples using X-band rectangular waveguides.
