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Lee Kong Chian Faculty of Engineering and Science
Published Scholarly Output
Finding the worst case supply noise excitation methodology for high speed I/O interfaces
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Finding the worst case supply noise excitation methodology for high speed I/O interfaces
Journal
2011 3rd Asia Symposium on Quality Electronic Design (ASQED)
Date Issued
2011-07
Author(s)
Fern Nee Tan
Lee Sheng Chyan
Faculty of Engineering and Green Technology
Faidz Abd Rahman
Lee Kong Chian Faculty of Engineering and Science
DOI
10.1109/ASQED.2011.6111739
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