Finding the worst case supply noise excitation methodology for high speed I/O interfaces

Fern Nee TanLee Sheng Chyan0000-0003-0964-9589Faidz Abd Rahman2025-01-022025-01-022011-0710.1109/ASQED.2011.6111739https://dspace-cris.utar.edu.my/handle/123456789/9830Finding the worst case supply noise excitation methodology for high speed I/O interfacesproceedings-article