K. Y. YouY. S. LeeL. ZahidM. F. A. MalekK. Y. LeeE. M. ChengN. H. H. Khamis2024-12-312024-12-312015-11-1610.11113/jt.v77.6286https://dspace-cris.utar.edu.my/handle/123456789/9352This paper presents a calculation of the dielectric properties of low-loss materials using the transmission phase-shift method. This method can provide calibration-independent and position-insensitive features, and it was verified experimentally by measuring several well-known samples using X-band rectangular waveguides.journal-article