Efficient Device-Edge Inference for Disaster Classification

Nathaniel Tan Sze YangMau-Luen ThamSing Yee ChuaYasunori OwadaYing Loong LeeSuvit Poomrittigul2024-10-212024-10-212022-07-0510.1109/ICUFN55119.2022.9829668https://dspace-cris.utar.edu.my/handle/123456789/3736Efficient Device-Edge Inference for Disaster Classificationproceedings-article